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Metrology – Statistical Analysis of Measurement Uncertainty
This Webinar is over
Date | Oct 17, 2018 |
Time | 03:00 PM EDT |
Cost | $200.00 |
Online
|
The seminar begins with an examination of the fundamental vocabulary and concepts related to metrology. Topics include: accuracy, precision, calibration, and “uncertainty ratios”. Several of the standard methods for analyzing measurement variation are then described and explained, as derived from AIAG’s Measurement System Analysis reference book. The methods include: Gage R&R (ANOVA method, for 3 gages, 3 persons, 3 replicates, and 10 parts), Gage Correlation (for 3 gages), Gage Linearity, and Gage Bias.
Areas Covered in the Session :
Who Will Benefit:
Areas Covered in the Session :
- Fundamental Vocabulary & Concepts
- Gage Repeatability and Reproducibility (ANOVA method)
- Gage Correlation
- Gage Linearity
- Gage Bias
- Uncertainty Budgets and Guard-banded Specifications
Who Will Benefit:
- QA/QC Supervisors
- Process Engineers
- Manufacturing Engineers
- QC/QC Technicians
- Manufacturing Technicians
- R&D Engineers
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