Metrology – Statistical Analysis of Measurement Uncertainty

MessageThis Webinar is over
Date Oct 17, 2018
Time 03:00 PM EDT
Cost $200.00
The seminar begins with an examination of the fundamental vocabulary and concepts related to metrology. Topics include: accuracy, precision, calibration, and “uncertainty ratios”. Several of the standard methods for analyzing measurement variation are then described and explained, as derived from AIAG’s Measurement System Analysis reference book. The methods include: Gage R&R (ANOVA method, for 3 gages, 3 persons, 3 replicates, and 10 parts), Gage Correlation (for 3 gages), Gage Linearity, and Gage Bias.

Areas Covered in the Session :
  • Fundamental Vocabulary & Concepts
  • Gage Repeatability and Reproducibility (ANOVA method)
  • Gage Correlation
  • Gage Linearity
  • Gage Bias
  • Uncertainty Budgets and Guard-banded Specifications

Who Will Benefit:
  • QA/QC Supervisors
  • Process Engineers
  • Manufacturing Engineers
  • QC/QC Technicians
  • Manufacturing Technicians
  • R&D Engineers


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